仪器详情
用户评价
功能/应用范围：
Junction Leakage; Contact spiking; Hot Electrons; Latch-Up; Gate oxide defects/leakage; Poly-silicon Filaments; Substrate damage Junction Avalanche等
主要技术指标：
Junction Leakage; Contact spiking; Hot Electrons; Latch-Up; Gate oxide defects/leakage; Poly-silicon Filaments; Substrate damage Junction Avalanche等
服务内容：
无
服务典型成果：
无
用户须知：
对外服务时间:8:30-17:30。参数：Junction Leakage; Contact spiking; Hot Electrons; Latch-Up;
Gate oxide defects/leakage; Poly-silicon Filaments; Substrate damage
Junction Avalanche等。附件：探针座
收费标准：
面议